| 기업명 |
|
| Company name |
KOREA SPECTRAL PRODUCTS |
| 대표명 (CEO) |
Lee Chang sug |
| 대표전화 (Phone) |
02-2109-8871 |
이메일 (E-mail) |
sales@ksp.co.kr |
| 홈페이지 (Web Site) |
www.ksp.co.kr |
주소
(ADD.) |
Room #402, 273, DIGITAL-RO, GURO-GU, SEOUL, SOUTH KOREA |
주요생산품
Major Product |
SM245N&SM642N& SM303N Spectrometer |
주요 사업분야
(Major Business) |
Spectrometer manufacture and sales |
기업 소개
(Company Info.) |
Since its establishment in 2003, Korea Spectral Products(KSP) has been providing customized optical sensing systems to the world's leading semiconductor and sensor companies through a variety of spectrometers, optical accessories, and special OEM designed optical system. As a leading materials and components company in the optical measurement market, we are working with academia to promote the widespread use of optical diagnostics |
제품(1)
Product(1) |
SM245N&SM642N& SM303N Spectrometer |
제품설명
Description |
Process monitoring, self-calculation and diagnostic actors provided Remote OES data transfer without using a controller Simultaneous operation of more than 10 channel spectrometers Very low failure rate and automatic reconnection |
제품 사진
Product photo |
|
제품(2)
Product(2) |
SM304 Spectrometer |
사용용도
Use of Product |
NIR Spectroscopy for component analysis, high thickness film measurement, and real-time gas monitoring |
제품설명
Description |
Provides information for OES diagnosis in extended wavelength band up to 2.5 um Used for a long time without affecting the viewport cloud effect Component monitoring for various chemical species and films Measurement of film properties for high thickness film. Used as a spectral sensor for SE/SR measurement |
제품사진
Product photo |
|
제품(3)
Product(3) |
SM301 Spectrometer |
사용용도
Use of Product |
Realtime Monitoring of the MWIR spectrum |
제품설명
Description |
The simplest spectroscopic system that can measure up to MWIR Applications-Infrared laser/environmental/medical/food/pharmaceutical/product
manufacturing/defense/aviation |
제품사진
Product photo |
|
기술 설명
Description |
ㅇ Semiconductor&Display Manufacturing Process Diagnostics&Monitoring
- Semiconductor/display process monitoring and diagnosis system(OES system) technology, it is possible to detect leakage in real time due to inflow of outside air. Plasma principal factors(PI) such as gas temperature, electron temperature and electron density can be analyzed |
기술설명
Description |
ㅇ Material Analysis
- A variety of materials can be analyzed, including Raman and fluorescence/phosphorescence(PL) analysis, and refractive index analysis using ellipsometry |
기술설명
Description |
ㅇ Biomedical&Environmental
- High-speed single/multi-channel blood test and diagnosis system using component test and condition diagnosis technology. Near-infrared spectrophotometer-based liquid fertilizer component analyzer(liquid sample analysis possible) |
첨 부
Attachment |
 (주)코리아스펙트럴덕츠.pdf
|
